Tag Archives: ADXL356

Accelerometers for vibration measurements & wireless condition monitoring

Graham Prophet @ eedesignnewseurope.com discuss about two new MEMS accelerometers from Analog Devices:

Analog Devices (ADI) has added two devices to its low noise, low drift, low power, three-axis MEMS accelerometers. The low noise performance over high frequencies provided by the ADXL356 and ADXL357 MEMS accelerometers delivers high resolution vibration measurements that enable the early detection of machine failure in condition monitoring applications.

Accelerometers for vibration measurements & wireless condition monitoring – [Link]