Computationally, yes; I haven't the resources. But what good would it
do? Since the signal frequency may be above or below the sample rate,
the spectrum is hopelessly mutilated and folded.
John
Well, here's what I'm thinking. Since you can't do it anyway, I'm not
developing it very fully or carefully.
The spectrum is not hopelessly mutilated and folded. If the input is
a sine wave, then there will still be a peak in the frequency domain.
You just won't know how many times it has been aliased around. That's why
you would perhaps want to do two FFT's with different sample rates.
If you have a distinct peak away from DC, then you know you are not
aliased to DC, so you can use the height of the peak and the height of
the DC bin to get your signal amplitude and DC offset, respectively. If
you don't have a peak away from DC, then you know you are either aliased
to DC or there is a fault in the signal synthesis. A second FFT with a
strategically chosen sample rate will resolve the ambiguity.
There's more to it than this. You wouldn't want to use ONLY the height of
the highest bin, you'd want to use the height of the highest bin plus the
heights of adjacent bins. And you may not want to ONLY use the DC bin, but
the first two bins. Etc., etc.
The other idea I had was to sweep the sample rate linearly. In FFT land,
that would smear the signal, and allow you to estimate RMS regardless of
aliasing, perhaps. I haven't really thought it through.
Oh well. Have fun. ;-)
--Mac